SEM Specimen Stubs, 12.7mm dia, 45/90deg chamfer, 9.5mm pin

51-1625-0269
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.
€ 7.00
In Stock 15

Description

SEM Specimen Stubs, 12.7mm dia, 45/90deg chamfer, 9.5mm pin

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