NCLPt

804.NW.NCLPT
Silicon probe with long cantilever and PtIr coating for tapping/non-contact mode. 190 kHz. 48 N/m

Each pack contains 10 probes. 
This product is not in stock but you can order and it will take around two weeks to get delivered.
€ 390.00
Pre Order Now

Description

f = 190 kHz   |   k = 48 N/m   |   tip coating: PtIr
Non-contact / Tapping™ mode - Long Cantilever - PtIr5 coating NanoWorld Pointprobe®
NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH.

The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
The tip radius of curvature is less than 25 nm.

Details

  • NCLPt Specifications
  • Frequency (kHz):
    190.0
  • Spring Constant (N/m):
    48.0
  • Tip Radius (nm):
    25.0
  • Tip Height (um):
    12.5
  • Length, Width, Thickness (µm):
    225 x 38 x 7
  • Tip Shape:
    4 sided
  • Tip Material:
    Silicon
  • Tip Coating:
    Cr/PtIr
  • Reflective Coating:
    Cr/PtIr
  • Manufacturer:
    Nanoworld

Recently Viewed